Abstract
In this work a novel radiation tolerance technique based on modular redundancy, associated to an alternated biasing scheme, is presented. The goal of this technique is to extend electronic systems lifetime in radiation environments for circuits that are susceptible to TID effects. In order to validate this technique, a board level prototype was built, considering an FPAA (Field Programmable Analog Array) as Device Under Test (DUT), to which the concept was applied. The prototype was exposed to Co60 gamma radiation with a dose rate of 1krad(Si)/h. Results show that devices that are alternated biased are able to tolerate higher accumulated doses than the one that is permanently biased.
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