Inference in the generalized exponential distribution under partially accelerated tests with progressive Type-II censoring

Abstract

Accelerated life testing (ALT) or partially accelerated life testing (PALT) is frequently used in modern reliability engineering. This paper considers the statistical inference on the generalized exponential distribution parameters in presence of progressive Type-II censoring with random removals under PALT, where the number of units removed at each failure time has a binomial distribution. The maximum likelihood method is used to estimate the unknown parameters in the case of step-stress partially accelerated life tests. The performance of the estimators is investigated numerically for different parameter values and sample sizes. Also, the approximate confidence bounds of the model parameters are obtained. Finally, a simulation study is made for illustrative purposes.