Abstract
A pulsed inductive microwave magnetometer (PIMM) is used to examine magnetization dynamics. The thin film sample is brought into close proximity to the coplanar waveguide, which allows for simple changing of samples. The angle between the easy axis (e.a.) and field direction can easily be varied by rotation of the sample on the waveguide. The magnetization dynamics, i.e., precessional frequency, decay time, and precessional amplitude, are determined with respect to this angle or the bias field for epitaxial Fe1−xCox films with different anisotropies. The two precessional motions of a magnetic double layer (FeCo∕Au∕Ni80Fe20) where resolved with the PIMM, which is promising for future investigations on exchange coupled layers.
Published Version
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