Indirect measurement of high grid strip densities over Nyquist sampling rate based on the moiré pattern analysis for quality assurance in grid manufacturing

Abstract

Abstract We have recently developed very precise carbon-interspaced antiscatter grids having a wide range of grid strip densities ( i.e. , 85–234 lines/in.) by adopting the sawing process, depending on the demands of specific imaging modalities. However, because grid strips of the recently developed grids are mostly invisible through X-ray nondestructive testing due to their high strip densities, quality assurance in the manufacturing has not yet satisfactorily made. In this work, we proposed a pragmatic method to measure actual grid strip densities over the Nyquist sampling rate based on the moire pattern analysis. We prepared several samples of the carbon-interspaced grids having nominal grid strip densities of 85, 103, 130, 150, 178, 203, 215, and 234 lines/in. and measured their strip densities by using the proposed method to demonstrate its viability assessment. The differences between the nominal and the measured grid strip densities were less than about 1.8%, indicating the proposed method is useful for the quality assurance in grid manufacturing.