Abstract
AbstractCommercially available quantum dots have been encapsulated in a poly(methyl methacrylate) film and used as a luminescent downshifting layer on cadmium sulfide/cadmium telluride photovoltaic devices. Application of these films has resulted in a relative improvement to the short‐circuit current of over 4% by I–V measurement, with a significant increase in the contribution of short‐wavelength light resulting in 25% of the current available in this part of the spectrum being captured. The films have been shown to be highly scattering and the associated difficulties this provides to external quantum efficiency measurements have been discussed. A range of optical characterisation techniques, particularly laser beam induced current, have been used to probe the effect the films have on a cadmium sulfide/cadmium telluride device. An alternate methodology for performing external quantum efficiency measurements with the quantum dot films has been proposed. Copyright © 2013 John Wiley & Sons, Ltd.
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