Abstract
X-ray photoelectron spectroscopy (XPS) has been used to investigate the composition of perovskite films upon exposure to different environmental factors, such as moisture, heat, and UV light. However, few research studies have determined that the X-ray itself could cause damage to the perovskite crystals. In this study, the X-ray-induced degradation of CH3NH3PbI3 perovskite films was investigated via XPS within an in situ ultrahigh vacuum system. It is demonstrated that fresh methylammonium lead iodine contains Pb2+ without the initial existence of Pb0. The Pb0 signal was discovered after a few hours of soft X-ray exposure, which indicates that the CH3NH3PbI3 perovskite structure undergoes a decomposition process to form metallic Pb. In addition, the nitrogen content was found to be significantly decreasing in the first hour of X-ray exposure. The discovery of the X-ray-induced chemical state change and the volatile methylamine of perovskite crystals could be further applied as an indicator for the field of X-ray sensors or detectors.
Highlights
Lead-based organic–inorganic hybrid perovskites have recently attracted much attention as superior light-harvesting materials and offer high power conversion efficiencies of >25% for certified cells[1]
The perovskite films in mesoscopic perovskite solar cells (PSCs) were made using a precursor by a one-step deposition method[13], which led to an unstable film morphology and large variations in the cell efficiency
A sequential deposition method was developed to control the morphology of the perovskite films, which led to a better device performance and repeatability[10]
Summary
Lead-based organic–inorganic hybrid perovskites have recently attracted much attention as superior light-harvesting materials and offer high power conversion efficiencies of >25% for certified cells[1]. The X-ray source in the XPS system was used to hit the perovskite films and in situ detect the elemental composition and the chemical states after the specimen was aged.
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