Abstract

New very fast and efficient detectors, installed both on laboratory instruments and synchrotron facilities, allow the monitoring of solid-state reactions from subsecond to minute scales with the production of large amounts of data. Traditional “one-by-one” pattern refinement needs complementary approaches, useful to handle hundreds to thousands of X-ray patterns. Principal-component analysis (PCA) has been applied to these fields in the last few years to speed up analysis with the specific goals of assessing data quality, identifying patterns where a reaction occurs, and extracting the kinetics. PCA is applied to the adsorption/desorption of Xe and CO2 within a Y zeolite. CO2 sequestration is a key issue in relation to climate change, while Xe is a critical raw material, and its purification is an important topic for the industry. At first, results were compared to traditional sequential Rietveld refinement. CO2-Y data were also compared with in situ single crystal data to investigate the different potentialities of PCA in the two cases. Two CO2 adsorption sites were confirmed, while three Xe sites were identified. CO2 showed a more linear adsorption trend with decreasing temperature, while Xe showed a more sigmoidal-like trend. Xe only showed site-dependent behavior in adsorption. Finally, PCA and correlation analysis, applied to analyze the parameters obtained from Rietveld refinement, highlighted finer details: in particular, this approach showed that the Y zeolite framework responded differently to CO2 and Xe adsorption.

Highlights

  • The study of microporous [1] and layered [2,3] materials by X-ray powder diffraction (XRPD) can give useful structural and dynamic information on these systems, making it very interesting for many industrial applications

  • In situ XRPD data were collected from 300 K to 200 K and back to 300 K to fully explore both the adsorption and the desorption process

  • Principal-component analysis (PCA) and Rietveld analysis are discussed together (Section 3), using PCA to examine parameters coming from Rietveld refinement

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Summary

Introduction

The study of microporous [1] and layered [2,3] materials by X-ray powder diffraction (XRPD) can give useful structural and dynamic information on these systems, making it very interesting for many industrial applications. Detectors with high spatial and energy resolution, both 2D [4] and 1D, installed both on lab instruments [5] and synchrotron facilities [6], allow the monitoring of solid-state reactions by in situ X-ray powder diffraction from subsecond to minute scales, with the production of large amounts of data. The complexity of the space and the amount of data represent the typical issue of the XXI century crystallographer, i.e., how to quickly and efficiently analyze thousands of X-ray datasets, possibly combined with data from other probes [8]. As pointed out by Crystals 2020, 10, 483; doi:10.3390/cryst10060483 www.mdpi.com/journal/crystals

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