Abstract
Chemical bath-deposited (CBD) cadmium sulfide has been a component in some of the most efficient Cu(In,Ga)Se 2-based solar cell devices. While accurate in situ measurements of the thicknesses of vacuum-based depositions can be accomplished with quartz crystal monitors, solution-based growth rates of CdS vary greatly on different substrates and are therefore difficult to measure. This work discusses the effectiveness of using an optical reflectance-based measurement of the growing film to determine the film’s thickness. On specular molybdenum films the measurement is accurate, while on the rough, poorly reflecting Cu(In,Ga)Se 2 (CIGS) films, the measurement is hampered.
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