Abstract
The new JEOL 3000F high resolution electron microscope at BNL has been optimized for Lorentz imaging. The necessary field-free environment around the sample is obtained by switching off the objective lens in the free-lens control mode, and the associated reduction in magnification is compensated for by a Gatan post-column image filter (GIF) at ∼ 20x magnification. Fresnel imaging is obtained by defocusing with objective mini-lens (OM). The use of low angle diffraction with an aperture located at the back focal plane makes it possible to obtain Foucault images.In-situTEM dynamic magnetizing experiments combined with Lorentz magnetrc microscopy both in Fresnel and Foucault modes were used to characterize the magnetic structure of some hard and relatively soft magnets, Nd13.75Fe80.25B6 and Pr13.75Fe80.25B6, prepared by different processing routes. The goal of these in-situexperiments was to develop a reliable and effective procedure to search for, identify, and classify the different pinning centers present in real magnets that accord with their “pinning power” versus applied magnetic field.
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