Abstract
Tetragonal zirconia polycrystals (TZP) have become of interest due to their exceptionally good combination of mechanical properties. In a previous study the microstructure/microchemistry of grain boundaries (GBs) in CeO2 stabilized ZrO2 (Ce-TZP) was investigated and evidence was found on the existence of vitreous ana crystalline intergranular phases in these ceramics. Recently, the observation of wavy GBs in ceria-zirconia was reported. This phenomenon was attributed to diffusion-induced grain boundary migration (DIGM). In the present work, the in-situ TEM observation of GB migration in Ce-TZP, nominally at room temperature, is reported.Thin foils for TEM observations were prepared from a Ce-TZP ceramic nominally composed of 90 mol% ZrO2 plus 10 mol% CeO2 and were examined in a Philips EM 420 analytical STEM, operated at 120 kV. Grain boundaries were observed to migrate in specimen areas exposed to extensive electron irradiation during TEM experiments. The micrograph in Fig. 1 shows a BF image of a triple grain junction (TJ) area in the as-prepared state.
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