Abstract
The composition of mercury cadmium telluride (CMT) layers has to be adjusted very precisely. Small changes in cadmium concentration induce variations in the optical transitions which may be observed by a non-perturbing optical method like ellipsometry. To control the growth of CMT layers, we have equipped a standard Riber 2300P MBE chamber with a spectroscopic ellipsometer. We developed a modification of an automatic ellipsometer with rotating polarizer by adding a reflecting mirror in quasi-normal incidence. The measured parameters are tan 2(ψ) and cos(2Δ) (double reflection on the sample). A standard viewport of the MBE chamber permits measurements to be made with an angle of incidence of about 70° in the growth position. We present measurements of the initial growth rate and composition of CMT during MBE growth.
Published Version
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