In-situ Observation of Fullerene Ultrathin Films by Using Total Reflection X-ray Diffraction-Organic Molecular Beam Deposition Method(TRXD-OMBD).

Abstract

For the purpose of confirming the growth mechanism of organic ultrathin films prepared by organic molecular beam deposition (OMBD), we employed a new combined system of total reflection X-ray diffraction method (TRXD) and OMBD. By using this system (TRXD-OMBD), the in-situ observation of cohesive structures and growth modes in organic ultrathin films were performed. In this study, the in-plane structure and orientation of fullerene (C60) ultrathin films epitaxially grown on oriented silver (Ag) surfaces were examined during the deposition. It was confirmed that the C60 ultrathin film formed the hexagonal closed packed (hcp) structure and the epitaxial structure of C60 on the Ag (111) surface occurred at the thickness of a few nanometer, namely the (2√3× 2√3) R30° structure as a stable state. Further, the growth modes of C60 ultrathin films were examined by the in-situ observation of total reflection fluorescence X-rays of Ag. In this paper, we noted the possibility of various analysis on organic ultrathin films and surfaces by our TRXD-ONBD system.