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Abstract
Growth of Fe film on MgO is investigated using in situ MOKE for different surface conditions of MgO (001). Interfacial magnetic dead layer of Fe film on MgO is significantly affected by the presence of contaminations at surface of MgO. No magnetic dead layer is observed at the Fe/MgO interface, when the substrate was etched followed bzy annealing. However, a magnetic dead layer of 2 nm is observed at Fe/MgO interface when MgO substrate was just annealed. In order to observe the role of stoichiometry on interfacial properties, a near stoichiometric MgO film was prepared using e-beam evaporation. From x-ray photoelectron spectroscopy (XPS) measurements the stoichiometry of MgO film comes out to be slight O-deficient (Mg55O45). A high thick magnetic dead layer of 3.4 nm has been observed at Fe/MgO film interface, which may be attributed to weak off stoichiometric composition of MgO film.
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