Abstract
A frequency modulation (FM) reflectometer is designed to linearly sweep the microwave frequency in order to diagnose the plasma density profile. The static characteristic curve of the frequency versus the control voltage can be easily measured by using a spectrum analyzer. However, it is not guaranteed that the characteristic curve will be the same when the frequency is swept. A technique is devised which measures the dynamic characteristics by using the reflectometer itself. The results show that the shape of the characteristic curve does not depend on the sweep rate but on the time delay between the control voltage of the function generator and the microwave frequency at the detector input. This time delay should be compensated. Based on this measured characteristic curve, the frequency sweep rate and the distance between the antenna and the vacuum chamber are experimentally determined.
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