Abstract
The phenomenon of Ag-photodoping in an amorphous As2S3 film was examined by an ellipsometric method. The observed ellipsometric parameters Ψ and Δ were fitted using multilayer models. It was observed that the thickness of each layer of the Ag, Ag-doped As2S3 and As2S3 system showed a timed-dependency. From these behaviors, the main features of photodoping in a double-layer, Ag/As2S3 were confirmed. The composition of Ag-doped As2S3 layer was estimated to be Ag2.6As2S3 from the amounts of consumed Ag and As2S3.
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