Abstract
An electric-field-induced contrast mechanism for scanning electron microscopy is reported which permits the visualization of embedded nanomaterials inside various matrices with high contrast and high definition. The high contrast is proposed to result from localized enhancement of secondary electron emission from the nanomaterials due to electric-field-induced changes in their work functions. By utilizing a stage that allows in situ current-voltage measurements inside a scanning electron microscope, single-walled carbon nanotubes embedded within polymethyl methacrylate films were visualized directly. In addition to the rapid assessment of nanotube dispersion within polymers, electric-field-induced contrast imaging enables the determination of percolation pathways. From the contrast in the images, the relative voltage at all points in the electron micrograph can be determined, providing a new mechanism to understand electronic percolation through nanoscale networks.
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