Abstract
We have combined optical fiber probe and nanoprobe techniques in a scanning electronmicroscope, which enables in situ optical, electrical and structural characterization ofoptoelectronic nanomaterials and nanodevices. The nanoprobe technique, employing sharpmetal tips, is used for in situ nano-manipulation, contact and electrical measurement. Thefiber probe, coupled to a spectrometer or a laser and controlled by a nano-manipulator,allows local optical detection or excitation. We show in situ assembly of a light emitter andphotodetector based on individual nanostructures, demonstrating the potential applicationof the above technique in building prototype optoelectronic devices and selecting suitablenanostructures for device purposes. In addition, the angular resolving power of the fiberprobe detection is demonstrated to be useful for studying nanoscale waveguides.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
