Abstract
The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.
Highlights
In recent years, low-dimensional materials were intensively investigated revealing superior properties for nanostructures compared to their bulk counterparts
Pioneered by Uchic et al [6], mechanical tests on micro- and nanostructures demonstrated increasing yield strengths with decreasing structure size reaching the ultimate limit of the material for defect scarce nanowires
To avoid any sliding during three-point bending tests, the suspended nanowires were glued at their contact points with the Si substrate by carbon deposition from the residual gas in a Scanning Electron Microscopy (SEM) chamber
Summary
Low-dimensional materials were intensively investigated revealing superior properties for nanostructures compared to their bulk counterparts. In situ experimental techniques were developed that are compatible with scanning and transmission electron microscopy or synchrotron X-ray diffraction techniques providing access to the evolution of the deformation during mechanical loading [7,8,9,10,11]. Such in situ experiments demonstrated, for instance, pseudo-elastic behavior by reversible twinning/de-twinning of Au nanowires [12] and the activation of unexpected slips systems [13,14]. Electron transparent samples are needed and the limited available space strongly restricts the sample environment for in situ experiments
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