Abstract
The in situ measurement and control of the direction and magnitude of the magnetic field is demonstrated within the sample plane of a low-temperature ultra-high vacuum scanning probe microscope. These measurements utilized electrically detected magnetic resonance magnetometry based on the spin-dependent recombination current in a conducting polymer-thin film. The presented magnetometry approach allows the absolute measurement of systematic magnetic offset fields with a resolution on the order of ≈5μT/Hz with an angular resolution below ≈1°. As the polymer film covers a macroscopic area within the sample plane, magnetometry becomes possible at various locations within the sample plane and thus the determination of magnetic field gradients.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
