Abstract
A hard X-ray full field transmission X-ray microscopy (TXM) based on zone plate optics has been constructed at BL18B beamline at Shanghai Synchrotron Radiation Facility (SSRF). This beamline aims to the frontier science issues demands in many fields including nanomaterials, energy and life sciences, providing advanced nanostructure characterization for submicron-sized samples. It uses a bending-magnet source and works in the range of energies from 5 keV to 14 keV. The achieved spatial resolution of TXM imaging is 20 nm. This paper describes the details of the design, characterization, stability testing, TXM, CT and 2D TXM-XANES performance of this beamline.
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