Abstract
Automotive market is evolving rapidly, while boosting and growing semiconductor industry significantly. According to the experts, we are only in the beginning of this exciting new chapter in the evolution – Autonomous Driving. Functional safety and quality requirements for Automotive are taking clearer shape while the industry is progressing for maturity. Therefore, System-on-Chip (SoC) and Intellectual Property (IP) providers must come up with a tailored and adaptive solution, to overcome various challenges. This process is enriching for all parties – SoC providers in incorporating various IPs that addresses different aspects, as well as providing the IP vendors with comprehensive guidelines to enhance their products to adhere these requirements. As a direct consequence to this process, Test and Repair IPs are influenced heavily. This paper presents a full-scale in-field test and repair solution concept for Automotive SoCs which conforms to all safety and quality requirements. • Built-in self-test • Automotive • In-field test • Functional safety • System-on-chip
Published Version
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