In-air micro-PIXE chemical state analysis of phosphorus and sulfur using a new parallel-beam wavelength-dispersive X-ray emission spectrometer

Abstract

The proton induced K X-ray emission spectra of several different phosphorus and sulfur compounds were recorded with the new parallel-beam wavelength dispersive X-ray emission spectrometer. The spectrometer was installed recently at the external proton microbeam at the J. Stefan Institute to perform high energy resolution in-air micro-PIXE analysis in the tender X-ray range. Reported measurements are used to probe the capabilities of the spectrometer to perform also chemical state analysis. For phosphorus measurements, where the energy resolution of the spectrometer is the highest, a clear correlation between measured energy position of the Kα emission line and the phosphorus formal oxidation state is obtained. Chemical contrast is increased further in the Kβ emission spectra reflecting the structure of occupied valence molecular orbitals defined by the first coordination shell around the central phosphorus atom. A reasonable chemical contrast is maintained also in the sulfur Kβ emission spectra, despite the fact that the energy resolution of the spectrometer declines with increasing X-ray energy. Finally, an example of phosphorus speciation in reference biological material is presented, demonstrating the feasibility of the new setup to extend the capabilities of in-air micro-PIXE analysis towards chemical speciation.