Abstract
Electrode segmentation of the cylindrical mirror analyzer has been shown to significantly improve the resolution of the standard instrument. The high precision solution which had been found for the 42.3 device is shown in this report to exist in fact for an extended set of input angles or equivalently for a range of sample positions. This has allowed a significant limitation of the CMA, namely the critical dependence of instrument performance on sample position, to be largely overcome. In addition by placing the sample at the minimum in the curve of resolution vs sample position, a base width resolution of ∼.00005 has been obtained for a ±6° bundle an improvement of a factor of ∼40 over the standard spectrometer. Thus electrode segmentation has been found not only to significantly improve the device performance, but in fact to enable its high precision to be realized.
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