Improving Performance under Process and Voltage Variations in Near-Threshold Computing Using 3D ICs

Abstract

Near-threshold computing (NTC) circuits have been shown to offer significant energy efficiency and power benefits but with a huge performance penalty. This performance loss exacerbates if process and voltage variations are considered. In this article, we demonstrate that three-dimensional (3D) IC technology can overcome this limitation. We present a detailed case study with a 28nm commercial-grade core at 0.6V operation optimized with various 3D IC physical design methods. First, our study under the deterministic case shows that 3D IC NTC design outperforms 2D IC NTC by 29.5% in terms of performance at comparable energy. This is significantly higher than the 12.8% performance benefit of 3D IC at nominal voltage supplies due to higher delay sensitivity to input slew at lower voltages. Second, it is well demonstrated that transistor delay is more sensitive to voltage changes at NTC operation. However, our full-chip study reveals that IR drop effect on 2D/3D IC NTC performance is not severe due to the low power consumption and hence lower IR drop values. Third, die-to-die variation impact on full-chip performance is visible in 3D IC NTC designs, but it is not worse compared to 2D IC NTC designs. This is mainly due to the shorter critical path length in 3D IC NTC designs.