Abstract
ABSTRACTElectrostatic force microscopy (EFM) including its derivative, Kelvin probe force microscopy, is widely used to investigate mesoscopic/nanoscopic conducting/semiconducting structures and electrical interactions. However, the resolution of EFM in ambient is largely limited by the applicable force-detection techniques. This work demonstrates that the lateral resolution of ambient EFM can be significantly improved using an intermittent contact method in conjunction with a resonant multi-frequency method for electrostatic force detection. A lateral resolution of sub-10 nm is obtained. The high-resolution contrast reflects the variation of surface potential in sample on a nanoscale. The mechanism, which is attributed to the decreased effective tip-sample distance, is elucidated by theoretical analysis. The newly developed technique can be easily integrated with existing techniques to herald the next generation of high-resolution probe techniques for various nanoscopic applications.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
