Abstract
Peak pile-up and other pulse distortion effects in an Si(Li) detector for x-ray spectroscopy were studied using pulse shape analysis. The pile-up interval, τ, was reduced to about 100 ns by using a combination of selection criteria on leading edge, constant fraction and zero-crossing time signals as functions of pulse height on pulses from an Si(Li) detector used for x-ray detection. Distortions in charge collection, giving rise to tailing effects, were also studied. Such effects were observed and pulses were isolated, but no major reduction in the background could be achieved. The pile-up reduction technique was successfully applied to the analysis of geological specimens resulting in improved detection limits.
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