Abstract
We have made remarkable progress in detecting X-ray-induced frequency shift signals, which will promote development of a chemically sensitive NC-AFM. A highperformance controller provides a tenfold higher signal to noise ratio than that previously reported. We confirmed that the frequency shift or complementary Z-feedback signal dependence on X-ray energy has a peak. An important feature of the signal is that it does not follow the absorption spectrum of a surface element. These new findings are important to elucidate this novel X-ray-induced phenomenon.
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