Abstract
the paper examines the immunity of Quasi Delay-Insensitive (QDI) circuits to soft errors caused by noises. The considered noise sources are internal and external events: layout wires crosstalk, interference on the power and ground buses, electromagnetic pulse. The paper suggests using the failsafe QDI circuits discipline and layout methods that reduce dual-rail signal sensitivity to noises. Indication of dual-rail signal forbidden state as a spacer increases QDI circuits immunity to soft errors. Using a modified C-element to implement a pipeline stage register bit reduces the danger of the pipeline deadlock. It improves the immunity of the QDI pipeline to the noise soft errors by 11% (up to 97.8%).
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