SEU-Tolerant QDI Circuits

Wonjin Jang Wonjin Jang,A Martin

doi:10.1109/async.2005.30

SEU-Tolerant QDI Circuits

Wonjin Jang Wonjin Jang, A Martin

https://doi.org/10.1109/async.2005.30

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Publication Date: Mar 14, 2005

Citations: 62

Affiliation: California Institute of Technology

#Quasi Delay-insensitive Circuits #Quasi Delay-insensitive + Show 8 more

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Abstract

This paper addresses the issue of single-event upset (SEU) in quasi delay-insensitive (QDI) asynchronous circuits. We show that an SEU can cause abnormal computations in QDI circuits beside deadlock, and we propose a general method to make QDI circuits SEU-tolerant. We present simplified SEU-tolerant buffer implementations for CMOS technology. Finally, we present a case study of a one-bit comparator and show SPICE-simulation results.

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