Abstract

In this study, we investigated the effect of an Al2O3 barrier layer in an all-solid-state inorganic Li-based nano-ionic synaptic transistor (LST) with Li3PO4 electrolyte/WO x channel structure. Near-ideal synaptic behavior in the ultralow conductance range (∼50 nS) was obtained by controlling the abrupt ion migration through the introduction of a sputter-deposited thin (∼3 nm) Al2O3 interfacial layer. A trade-off relationship between the weight update linearity and on/off ratio with varying Al2O3 layer thickness was also observed. To determine the origin of the Al2O3 barrier layer effects, cyclic voltammetry analysis was conducted, and the optimal ionic diffusivity and mobility were found to be key parameters in achieving ideal synaptic behavior. Owing to the controlled ion migration, the retention characteristics were considerably improved by the Al2O3 barrier. Finally, a highly improved pattern recognition accuracy (83.13%) was achieved using the LST with an Al2O3 barrier of optimal thickness.

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