Abstract
This work studies self-heating effect using the modified RF characterization technique at cryogenic temperatures down to 77 K. It is shown that neglecting the transition related to the substrate effect in the output conductance frequency response can result in a strong underestimation of the thermal resistance, especially at bias conditions close to the threshold voltage (Vth) region and alter its temperature, length and bias dependencies which is important to consider for device modelling.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.