Abstract
In this article, a complete empirical large-signal model of GaN high electron-mobility transistors (HEMTs) is presented. The developed nonlinear model employs differentiable trigonometric function continuously to describe the drain-source current characteristic and its higher order derivatives, making itself suitable for the simulation of intermodulation distortion (IMD) in microwave circuits. Besides, an improved charge-conservative gate charge model is proposed to accurately trace the nonlinear gate-source and gate-drain capacitances. The model validity is demonstrated for different 0.25-µm gate-length GaN HEMTs. The simulation results of small-signal S-parameters, radio frequency (RF) large-signal power performances and two-tone IMD products show an excellent agreement with the measured data.
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