Abstract

In this work, we investigate the energy efficiency and memory window of split-gate ferroelectric FET (SG-FeFET) non-volatile memory (NVM) compared with the single gate ferroelectric FET (FeFET) NVM. A novel sequential write scheme is proposed to improve the read distinguishability (I R1 /I R0 ), memory window (MW), and energy efficiency of SG-FeFET NVM. Sufficient MW is essential to meet the retention and endurance requirements of ferroelectric oxide based NVM. The impact of gate length (L G ) on the MW and I R1 /I R0 of SG-FeFET and FeFET with MFMIS structure is analyzed. Our results show that with fixed MW, FeFET with longer L G (= 190 nm) requires 2.5 V write voltage (Vwrite); while FeFET with shorter L G (= 50 nm) decreases the Vwrite to 2 V. Our proposed SG-FeFET NVM (L G = 50 nm) with sequential write scheme can further reduce the Vwrite to 1.85 V, and improve the write energy by 21%. SG-FeFET NVM with improved energy efficiency is beneficial for hardware implementations of deep neural networks (DNNs) for low power AI and IoT applications.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call