Abstract
In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate “ringing” artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.
Highlights
Carbon nanotube atomic force microscopy (CNT-AFM) probes have demonstrated that they can provide high-resolution imaging of a number of different types of samples, including biomolecules [1,2,3], nanomaterials [4,5,6], and polymers [7]
The AFM probe was first brought into contact with a dangling single-walled CNTs (SWCNT), and non-covalent forces held the CNT onto the AFM probe, the SWCNT was cut by directing the electron beam at the CNT about 100 nm from the AFM probe with the water source injected
High resonant frequency is required for effective imaging in tapping mode (>100 kHz); PeakForce tapping (PFT) only re3q
Summary
Carbon nanotube atomic force microscopy (CNT-AFM) probes have demonstrated that they can provide high-resolution imaging of a number of different types of samples, including biomolecules [1,2,3], nanomaterials [4,5,6], and polymers [7]. While an AFM probe with an individual SWCNT attached to the tip should, on average, yield CNT-AFM probes with smaller diameters, MWCNT probes should provide greater stability due to their increased diameters. This will depend somewhat on the aspect ratio (length to width) of the attached CNT, regardless of whether it is SWCNT or MWCNT. The wear-resistant properties are expected to be similar for both types of CNT-AFM probes
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