Abstract
AbstractA method for fault detection probability estimation using statistical multi‐parameter circuit simulation is proposed, in order to check circuits for which double or multiple analogue measurements are utilized. Theoretical analysis for the estimation of the fault coverage is given, based on conditional probability calculations. The proposed method can be applied for both test measurement and input stimulus selection. Simulation results from the application of the method on typical analogue circuits—filter and amplifier—are given, showing a sufficient improvement over the fault coverage achieved by single measurements. Copyright © 2009 John Wiley & Sons, Ltd.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: International Journal of Circuit Theory and Applications
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
