Abstract
Characteristics of planar X-ray waveguide resonators (PXWRs) including the low total intensity of the beams they form are briefly discussed. Simple methods for the light gathering power enhancements are described. Experimental data characterizing some of the methods are presented. According to these data, equipping a PXWR with an input tapered total-external-reflection concentrator is presumably the most promising way to enhance the light gathering power of the resonator. It has been experimentally shown that the use of a symmetric tapered concentrator increases the light gathering power of the PXWR at least five times without distortion of the spatial intensity distribution of the X-ray beam formed by the resonator. The results of the implementation for the modified PXWR for diffraction analysis are presented.
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