Abstract
The authors present the design of a dynamic built-in current (BIC) monitor for a new on-chip analogue self-test methodology. This methodology uses dynarnic power supply current monitoring, and takes advantage of a redundancy in the structure of fully balanced circuits. The dynarnic BIC monitor is based on a second generation current conveyor CCII+, and offers accurate measurement of supply current with minimal degradation in power supply voltage.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have