Abstract
A silver nanoparticles (NPs) self-assembled monolayer (SAM) was introduced in the pentacene organic field-effect transistors using modified Langmuir–Schäffer (horizontal lifting) technique, and its effect was being evaluated electrically using current–voltage (I−V) and impedance spectroscopy (IS) measurements. The I−V results showed a significant negative threshold voltage shift indicating that hole trapping phenomena exist inside the devices with about two orders higher in the contact resistance and an order lower in the effective mobility when a SAM was introduced. The IS measurements with the simulation of Maxwell–Wagner equivalent circuit revealed that the incorporation of the NPs SAM had a comparable negative voltage shift as in I–V measurements with a higher trapping time based on the simulation results.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
