Abstract
Hopping conduction in transistors, i.e., under a transverse electric field, is addressed using percolation theory with a space-energy correlation in the density of states of the impurity band. The computation of the percolation threshold over an extended range of correlation parameters enables us to derive a formula, which, while giving the classical results in the low field limit, describes the emergence of a specific variable range hopping in the high field case. An application of this formula to experimentally extract the localization radius is also proposed.
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