Impact of neutron induced Single-Event Multiple Transients in ADDLL based frequency multiplier

Abstract

This paper presents the impact of radiation-induced Single-Event Multiple Transients (SEMT) in All Digital Delay-Locked Loop (ADDLL) and its impact on the output of frequency multiplier. The performance of the frequency multiplier such as the phase noise and jitter etc. are degraded due propagation of the SEMT from the ADDLL. This paper: (1) shows the impact of SEMTs in the ADDLL in modern technologies, (2) shows how the frequency multiplier circuit performance can vary depending on the severity of SEMTs effects, and (3) demonstrates proposed edge-combined ADDLL based frequency multiplier performance benefits for more reliable operation.