Abstract

The solid solutions of the (1-x)BiFeO3 – x/2PbFe1/2Nb1/2O3 -x/2PbFe2/3W1/3O3 system (x = 0.05, x = 0.50) were produced by conventional solid state technology using mechanical activation (MA). It is discovered that particle destruction occurs along planar defects (crystallographic shear planes, CSP) during MA. The MA has a different impact on the microstructure formation of the solid solutions (1-x)BiFeO3 – x/2PbFe1/2Nb1/2O3 – x/2PbFe2/3W1/3O3 system, depending on their localization on the phase diagram. It is shown that MA leads to an increase in the temperature stability of the dielectric properties in the solid solutions of the studied system.

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