Abstract
The metalorganic decomposition-derived SrBi2Ta2O9 (SBT) ferroelectric thin films were annealed in forming gas (5%H2+95%N2), and their fatigue characteristics were investigated. Although the hysteresis loops of these films had an unacceptable degradation under such a H2-containing reducing atmosphere, no obvious polarization fatigue with electric field cycling could be observed. However, an increase of P*r was observed over the initial period of the fatigue test. It could be viewed as a competition between the increase of P*r due to the leakage current and the decrease of P*r due to switching polarization. H2 played an important role in the increasing in the leakage current of SBT thin films, forming more weak pinning centers of domain walls, and degradation in the fatigue characteristics.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
