Abstract
Using a scanning near-field optical microscope with a metallic probe tip (Fig 1), we investigate the formation of near-field optical images. The scatter-probe is used only for converting an evanescent field to a propagating field and the detection system is in the far-field. This situation models the usual experimental set up employed in scatter-probe near-field microscopy. The calculations of the scattered intensity at constant height were based on an integral equation, method of moments approach.
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