Image formation with a scatter-probe near-field optical microscope

Abstract

Using a scanning near-field optical microscope with a metallic probe tip, we investigate the formation of near-field optical images. The scatter-probe is used only for converting an evanescent field to a propagating field and the detection system is in the far-field. This situation models the usual experimental set up employed in scatter-probe near-field microscopy. We study a 2D model of the scattering of s-polarized light, in which the object is illuminated by total internal reflection. The calculations of the scattered intensity at constant height were based on an integral equation, method of moments approach.