Abstract
The local density of states (LDOS) was characterized at the surface of the InAs thin film epitaxially grown on a GaAs(111)A substrate using low-temperature Scanning tunneling microscopy (LT-STM). The differential conductance (dI/dV) images show bias-dependent standing waves of the two-dimensional (2D) electronic states. Friedel oscillations, caused by the scattering and interference of 2D electrons in the surface accumulation layer, were observed. The dI/dV images also show a LDOS distribution in small InAs nanostructures. Calculations reveal that the LDOS distribution in each dI/dV image corresponds to a discrete zero-dimensional (0D) state in the nanostructures.
Published Version
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