Abstract
We have demonstrated that atom-resolved imaging of the n-type wide-gap semiconductor TiO2(110) can be achieved by noncontact scanning nonlinear dielectric microscopy (NC-SNDM). In the NC-SNDM images, parallel bright stripes along the [001] direction, reflecting Ti4+ rows, could be observed. An upward dipole moment was simultaneously measured at each Ti4+ site, although downward polarization could not be detected at the O2− sites. These results suggest that both the topography [εlocal(4)] and the electrical dipole moment [εlocal(3)] are influenced by the Ti4+ interaction between the tip and sites.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
