Abstract
Imaging local index variations by using a form of modulated near-field scanning optical microscopy is suggested. To test these ideas, we have probed two different optical structures, one a well-characterized BK-7 glass prism in the total internal reflection configuration, and the other a side-polished optical fiber waveguide with a step index of refraction of 4.5×10−3. Using a recently developed tapping-mode tuning-fork near-field scanning optical microscope, we have obtained images showing distinct local index variations. This method may have applicability to the characterization of a wide variety of optical waveguide structures.
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