Abstract
Original results are presented for the imaging of dielectric objects using an indirect planar microwave imaging system that employs an off-axis holographic concept. The ability of this intensity only planar recording technique to recover phase information about the object under test proves to be significant in the imaging of dielectrics. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 1957–1961, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21826
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