Abstract
The crystallographic phase and morphology of many materials change with the crystal size so that new needs arise to determine the crystallography of nanocrystals. Direct space high-resolution phase-contrast transmission electron microscopy (HRTEM) and atomic resolution scanning TEM (STEM) when combined with tools for image-based nanocrystallography in two (2D) and three (3D) dimensions possess the capacity to meet these needs. After a concise discussion of lattice-fringe visibility spheres and maps, this paper discusses lattice-fringe fingerprinting in 2D and tilt protocol applications. On-line database developments at Portland State University (PSU) that support image-based nanocrystallography are also mentioned.
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