Abstract
AbstractSince the crystallographic phase and morphology of many materials changes with the crystal size in the one to hundred nanometer range and the potential technological applications of nanoparticles are enormous, a need arises to determine the crystallography of nanoparticles individually. Direct space high- resolution phase-contrast transmission electron microscopy (TEM) and atomic resolution Z-contrast scanning TEM when combined with goniometry of direct and/or reciprocal lattice vectors offer the possibility of developing dedicated nanocrystallography characterization methods for such small nanoparticles. Although experimentally feasible for cubic nanocrystals with lattice constants larger than 0.4 nm in contemporary high-resolution TEMs with modest tilt range, image-based nanocrystallography by means of transmission electron goniometry has so far only been employed by a few specialists worldwide. This is likely to change in the future with the availability of aberration-corrected TEMs. The reasons why this change is likely to happen are outlined in this paper.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
